A DC Method to Extract Mobility Degradation and Series...

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IEEE Transactions on Electron Devices 2016

A DC Method to Extract Mobility Degradation and Series Resistance of Multifinger Microwave MOSFETs

Sucre-Gonzalez, Andrea, Zarate-Rincon, Fabian, Ortiz-Conde, Adelmo, Torres-Torres, Reydezel, Garcia-Sanchez, Francisco J., Muci, Juan, Murphy-Arteaga, Roberto S.
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Year:
2016
Language:
english
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/ted.2016.2538778
File:
PDF, 2.06 MB
english, 2016
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