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[IEEE 2016 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS) - Wien, Vienna, Austria (2016.1.25-2016.1.27)] 2016 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS) - Drain current local variability from linear to saturation region in 28nm bulk NMOSFETs
Karatsori, T. A., Theodorou, C. G., Haendler, S., Dimitriadis, C. A., Ghibaudo, G.Year:
2016
Language:
english
DOI:
10.1109/ulis.2016.7440060
File:
PDF, 884 KB
english, 2016