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[IEEE 2016 29th International Conference on VLSI Design and 2016 15th International Conference on Embedded Systems (VLSID) - Kolkata, India (2016.1.4-2016.1.8)] 2016 29th International Conference on VLSI Design and 2016 15th International Conference on Embedded Systems (VLSID) - Thermal-Safe Schedule Generation for System-on-Chip Testing
Karmakar, Rajit, Chattopadhyay, SantanuYear:
2016
Language:
english
DOI:
10.1109/vlsid.2016.47
File:
PDF, 704 KB
english, 2016