Modelling and characterisation of high-k dielectric...

IOP Conference Series Materials Science and Engineering 2010 / 02 Vol. 8

Modelling and characterisation of high-k dielectric Thin-films using microwave techniques

Chen, W, McCarthy, K G, Çopuroğlu, M, O'Brien, S, Winfield, R, Mathewson, A
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
8
Language:
english
Journal:
IOP Conference Series: Materials Science and Engineering
DOI:
10.1088/1757-899x/8/1/012020
Date:
February, 2010
File:
PDF, 574 KB
english, 2010
Conversion to is in progress
Conversion to is failed