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Modelling and characterisation of high-k dielectric Thin-films using microwave techniques
Chen, W, McCarthy, K G, Çopuroğlu, M, O'Brien, S, Winfield, R, Mathewson, AVolume:
8
Language:
english
Journal:
IOP Conference Series: Materials Science and Engineering
DOI:
10.1088/1757-899x/8/1/012020
Date:
February, 2010
File:
PDF, 574 KB
english, 2010