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[IEEE 2015 IEEE 22nd International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Hsinchu (2015.6.29-2015.7.2)] 2015 IEEE 22nd International Symposium on the Physical and Failure Analysis of Integrated Circuits - Timing analysis case studies using 1064 nm Continuous Wave laser for Fault Isolation on scan failures
Ranganathan, Gopinath, Ravikumar, Venkat-Krishnan, Phoa, Angeline, Chea-Wei Teo,Year:
2015
Language:
english
DOI:
10.1109/ipfa.2015.7224320
File:
PDF, 600 KB
english, 2015