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[IEEE 2015 IEEE International Symposium on Electromagnetic Compatibility - EMC 2015 - Dresden, Germany (2015.8.16-2015.8.22)] 2015 IEEE International Symposium on Electromagnetic Compatibility (EMC) - A combined time and frequency domain characterization method for modeling of overvoltage protection elements
Scheier, Stanislav, Deelmann, Dominik, Frei, Stephan, Widemann, Christian, Mathis, WolfgangYear:
2015
Language:
english
DOI:
10.1109/isemc.2015.7256368
File:
PDF, 989 KB
english, 2015