Analytical Extraction Method for Density of States in Metal...

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Journal of Display Technology 2016

Analytical Extraction Method for Density of States in Metal Oxide Thin-Film Transistors by Using Low-Frequency Capacitance-Voltage Characteristics

Wu, Wei-Jing, Chen, Chi-Le, Hu, Xiao, Xia, Xing-Heng, Zhou, Lei, Xu, Miao, Wang, Lei, Peng, Jun-Biao
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Year:
2016
Language:
english
Journal:
Journal of Display Technology
DOI:
10.1109/jdt.2016.2548505
File:
PDF, 275 KB
english, 2016
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