Developer Micro Interaction Metrics for Software Defect Prediction
Lee, Taek, Nam, Jaechang, Han, DongGyun, Kim, Sunghun, In, HohYear:
2016
Language:
english
Journal:
IEEE Transactions on Software Engineering
DOI:
10.1109/tse.2016.2550458
File:
PDF, 2.06 MB
english, 2016