Temperature and Voltage Measurement for Field Test Using an Aging-Tolerant Monitor
Miyake, Yousuke, Sato, Yasuo, Kajihara, Seiji, Miura, YukiyaYear:
2016
Language:
english
Journal:
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
DOI:
10.1109/tvlsi.2016.2540654
File:
PDF, 5.54 MB
english, 2016