[IEEE 2016 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS) - Wien, Vienna, Austria (2016.1.25-2016.1.27)] 2016 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS) - Intra-device statistical parameters in variability-aware modelling of resistive switching devices
Crespo-Yepes, A., Martin-Martinez, J., Rama, I., Maestro, M., Rodriguez, R., Nafria, M., Aymerich, X., Gonzalez, M. B., Campabadal, F.Year:
2016
Language:
english
DOI:
10.1109/ulis.2016.7440058
File:
PDF, 990 KB
english, 2016