[IEEE 2016 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS) - Wien, Vienna, Austria (2016.1.25-2016.1.27)] 2016 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS) - Analog performance of n- and p-FET SOI nanowires including channel length and temperature influence
Paz, Bruna Cardoso, Pavanello, Marcelo Antonio, Casse, Mikael, Barraud, Sylvain, Reimbold, Gilles, Vinet, Maud, Faynot, OlivierYear:
2016
Language:
english
DOI:
10.1109/ulis.2016.7440080
File:
PDF, 458 KB
english, 2016