Analysis of thin impurity doped layers in anodic alumina...

Transactions of the Institute of Metal Finishing 2010 / 05 Vol. 88; Iss. 3

Analysis of thin impurity doped layers in anodic alumina and anodic tantala films by glow discharge time-of-flight mass spectrometry

Molchan, I. S., Thompson, G. E., Skeldon, P., Trigoulet, N., Tempez, A., Chapon, P.
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Volume:
88
Language:
english
Journal:
Transactions of the IMF
DOI:
10.1179/174591910x12692576434617
Date:
May, 2010
File:
PDF, 327 KB
english, 2010
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