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[IEEE 2015 IEEE International Electron Devices Meeting (IEDM) - Washington, DC, USA (2015.12.7-2015.12.9)] 2015 IEEE International Electron Devices Meeting (IEDM) - STT-MRAM with double magnetic tunnel junctions
Hu, G., Lee, J. H., Nowak, J. J., Sun, J. Z., Harms, J., Annunziata, A., Brown, S., Chen, W., Kim, Y. H., Lauer, G., Liu, L., Marchack, N., Murthy, S., O'Sullivan, E. J., Park, J. H., Reuter, M., RobeYear:
2015
Language:
english
DOI:
10.1109/IEDM.2015.7409772
File:
PDF, 522 KB
english, 2015