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[IEEE 2015 IEEE 24th Asian Test Symposium (ATS) - Mumbai, India (2015.11.22-2015.11.25)] 2015 IEEE 24th Asian Test Symposium (ATS) - TestExpress - New Time-Effective Scan-Based Deterministic Test Paradigm
Mrugalski, Grzegorz, Rajski, Janusz, Solecki, Jedrzej, Tyszer, Jerzy, Wang, ChenYear:
2015
Language:
english
DOI:
10.1109/ats.2015.11
File:
PDF, 1.10 MB
english, 2015