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[IEEE 2015 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) - Pisa, Italy (2015.5.11-2015.5.14)] 2015 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) Proceedings - Accuracy improvement in gait analysis measurements: Kinematic modeling

Vergallo, P., Lay-Ekuakille, A., Angelillo, F., Gallo, I., Trabacca, A.
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Year:
2015
Language:
english
DOI:
10.1109/i2mtc.2015.7151587
File:
PDF, 966 KB
english, 2015
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