[IEEE 2009 International Conference on Test and Measurement (ICTM) - Hong Kong, Hong Kong (2009.12.5-2009.12.6)] 2009 International Conference on Test and Measurement - Research for digital circuit fault testing and diagnosis techniques
Su Wei,, Fan Tongshun,, Du Mingfang,Year:
2009
Language:
english
DOI:
10.1109/ictm.2009.5412926
File:
PDF, 518 KB
english, 2009