Toward Understanding Positive Bias Temperature Instability...

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IEEE Transactions on Electron Devices 2016

Toward Understanding Positive Bias Temperature Instability in Fully Recessed-Gate GaN MISFETs

Wu, Tian-Li, Franco, Jacopo, Marcon, Denis, De Jaeger, Brice, Bakeroot, Benoit, Stoffels, Steve, Van Hove, Marleen, Groeseneken, Guido, Decoutere, Stefaan
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Year:
2016
Language:
english
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/ted.2016.2539341
File:
PDF, 2.00 MB
english, 2016
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