[IEEE International Test Conference, 2003. ITC 2003. - Washington, DC, USA (Sept. 30-Oct. 2, 2003)] International Test Conference, 2003. Proceedings. ITC 2003. - IEEE 1149.6 - a practical perspective
Eklow, B., Barnhart, C., Ricchetti, M., Borroz, T.Volume:
1
Year:
2003
Language:
english
DOI:
10.1109/test.2003.1270875
File:
PDF, 830 KB
english, 2003