Exploration of Noise Impact on Integrated Bulk Current...

Journal of Electronic Testing 2016 / 4 Vol. 32; Iss. 2

Exploration of Noise Impact on Integrated Bulk Current Sensors

João Guilherme Mourão Melo,Frank Sill Torres
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Volume:
32
Language:
english
Journal:
Journal of Electronic Testing
DOI:
10.1007/s10836-016-5579-z
Date:
April, 2016
File:
PDF, 1.40 MB
english, 2016
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