Elastic-filtered electron diffraction for structure...

Journal of Electron Microscopy 1999 / 01 Vol. 48; Iss. 1

Elastic-filtered electron diffraction for structure determination of AIN specimen

Galaup, S., Kihn, Y.
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Volume:
48
Language:
english
Journal:
Journal of Electron Microscopy
DOI:
10.1093/oxfordjournals.jmicro.a023645
Date:
January, 1999
File:
PDF, 4.96 MB
english, 1999
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