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[IEEE 2008 71st ARFTG Microwave Measurement Conference - Atlanta, GA, USA (2008.6.20-2008.6.20)] 2008 71st ARFTG Microwave Measurement Conference - A load-pull wafer-mapper
Vanaverbeke, F., Vaesen, K., Xiao, D., Pauwels, L., De Raedt, W., Germain, M., Degroote, S., Das, J., Derluyn, J., Schreurs, D.Year:
2008
Language:
english
DOI:
10.1109/arftg.2008.4633315
File:
PDF, 258 KB
english, 2008