Use of atomic force microscopy to detect wavelength...

Use of atomic force microscopy to detect wavelength dependent changes in wood veneers, and spin coated lignin and cellulose films exposed to solar radiation

Meincken, M., Evans, Philip D.
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Volume:
1
Language:
english
Journal:
International Wood Products Journal
DOI:
10.1179/2042645310y.0000000005
Date:
November, 2010
File:
PDF, 578 KB
english, 2010
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