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Built-in self-test for bias temperature instability, hot-carrier injection, and gate oxide breakdown in embedded DRAMs
Kim, Dae-Hyun, Cha, Soonyoung, Milor, Linda S.Volume:
55
Language:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2015.06.077
Date:
August, 2015
File:
PDF, 2.36 MB
english, 2015