Stochastic technology life cycle analysis using multiple...

Technological Forecasting and Social Change 2016 / 05 Vol. 106

Stochastic technology life cycle analysis using multiple patent indicators

Lee, Changyong, Kim, Juram, Kwon, Ohjin, Woo, Han-Gyun
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Volume:
106
Language:
english
Journal:
Technological Forecasting and Social Change
DOI:
10.1016/j.techfore.2016.01.024
Date:
May, 2016
File:
PDF, 1.32 MB
english, 2016
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