[IEEE ESSDERC 2015 - 45th European Solid-State Device Research Conference - Graz, Austria (2015.9.14-2015.9.18)] 2015 45th European Solid State Device Research Conference (ESSDERC) - Charge trapping in gate-drain access region of AlGaN/GaN MIS-HEMTs after drain stress
Jauss, S. A., Schwaiger, S., Daves, W., Noll, S., Ambacher, O.Year:
2015
Language:
english
DOI:
10.1109/essderc.2015.7324712
File:
PDF, 303 KB
english, 2015