[IEEE 2015 IEEE International Radar Conference (RadarCon) - Arlington, VA, USA (2015.5.10-2015.5.15)] 2015 IEEE Radar Conference (RadarCon) - Target detection in SAR imagery by diffraction patterning
Morrison, Keith, Andre, Daniel, Blacknell, David, Muff, Darren, Nottingham, Matt, Bennett, JohnYear:
2015
Language:
english
DOI:
10.1109/radar.2015.7131146
File:
PDF, 1.84 MB
english, 2015