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SPIE Proceedings [SPIE Photonics for Industrial Applications - Boston, MA (Monday 31 October 1994)] Videometrics III - Evaluation of subpixel feature localization methods for precision measurement
Valkenburg, Robert J., McIvor, Alan M., Power, P. Wayne, El-Hakim, Sabry F.Volume:
2350
Year:
1994
Language:
english
DOI:
10.1117/12.189135
File:
PDF, 180 KB
english, 1994