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SPIE Proceedings [SPIE Defense and Security Symposium - Orlando (Kissimmee), FL (Monday 17 April 2006)] Laser Radar Technology and Applications XI - Improved breakdown model for estimating dark count rate in avalanche photodiodes with InP and InAlAs multiplication layers
Huntington, Andrew S., Compton, Madison A., Williams, George M., Kamerman, Gary W., Turner, Monte D.Volume:
6214
Year:
2006
Language:
english
DOI:
10.1117/12.668659
File:
PDF, 983 KB
english, 2006