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SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, USA (Sunday 1 August 2010)] Developments in X-Ray Tomography VII - Development of a CT scanner based on the Medipix family of detectors
Stock, Stuart R., Bones, Philip J., Butler, Anthony P. H., Ronaldson, J. Paul, Opie, Alex M. T.Volume:
7804
Year:
2010
Language:
english
DOI:
10.1117/12.862166
File:
PDF, 400 KB
english, 2010