[IEEE 2015 9th International Conference on Electrical and Electronics Engineering (ELECO) - Bursa, Turkey (2015.11.26-2015.11.28)] 2015 9th International Conference on Electrical and Electronics Engineering (ELECO) - A novel keypoint based forgery detection method based on local phase quantization and SIFT
Ustubioglu, Beste, Muzaffer, Gul, Ulutas, Guzin, Nabiyev, Vasif, Ulutas, MustafaYear:
2015
Language:
english
DOI:
10.1109/ELECO.2015.7394438
File:
PDF, 1.12 MB
english, 2015