Quantification of roughness and spatial distribution of...

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Materials Science in Semiconductor Processing 2016 / 3

Quantification of roughness and spatial distribution of dislocations in MBE and MOVPE grown LED heterostructures

Mutta, Geeta Rani, Carapezzi, Stefania, Vilalta-Clemente, Arantxa, Kauffman, Nils A.K., Grandjean, Nicolas, Cavallini, Anna
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Language:
english
Journal:
Materials Science in Semiconductor Processing
DOI:
10.1016/j.mssp.2016.03.017
Date:
March, 2016
File:
PDF, 3.14 MB
english, 2016
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