Near-edge X-ray absorption fine structure measurements...

Journal of Physics Conference Series 2009 / 09 Vol. 186

Near-edge X-ray absorption fine structure measurements using a laser plasma XUV source

Peth, C, Barkusky, F, Sedlmair, J, Gleber, S-C, Novakova, E, Niemeyer, J, Thieme, J, Salditt, T, Mann, K
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Volume:
186
Language:
english
Journal:
Journal of Physics: Conference Series
DOI:
10.1088/1742-6596/186/1/012032
Date:
September, 2009
File:
PDF, 473 KB
english, 2009
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