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Microwave imaging reflectometry for KSTAR
Lee, W, Hong, I, Leem, J, Kim, M, Nam, Y, Yun, G S, Park, H K, Kim, Y G, Kim, K W, Domier, C W, Luhmann, N CVolume:
7
Language:
english
Journal:
Journal of Instrumentation
DOI:
10.1088/1748-0221/7/01/c01070
Date:
January, 2012
File:
PDF, 231 KB
english, 2012