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Evaluation of the imaging properties of Microwave Imaging Reflectometry
Hong, I, Lee, W, Leem, J, Nam, Y, Kim, M, Yun, G S, Park, H K, Domier, C W, Luhmann, N CVolume:
7
Language:
english
Journal:
Journal of Instrumentation
DOI:
10.1088/1748-0221/7/01/c01077
Date:
January, 2012
File:
PDF, 211 KB
english, 2012