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Evaluation of critical depth ratio for soft V 2 O 5 film on hard Si substrate by finite element modeling of experimentally measured nanoindentation response
Gupta, A K, Porwal, Deeksha, Dey, Arjun, Mukhopadhyay, Anoop Kumar, Sharma, Anand KumarVolume:
49
Language:
english
Journal:
Journal of Physics D: Applied Physics
DOI:
10.1088/0022-3727/49/15/155302
Date:
April, 2016
File:
PDF, 1.82 MB
english, 2016