A novel method for sub-micrometer transverse electron beam...

Journal of Physics Conference Series 2010 / 06 Vol. 236

A novel method for sub-micrometer transverse electron beam size measurements using optical transition radiation

Aryshev, A, Boogert, S T, Howell, D, Karataev, P, Terunuma, N, Urakawa, J
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
236
Language:
english
Journal:
Journal of Physics: Conference Series
DOI:
10.1088/1742-6596/236/1/012008
Date:
June, 2010
File:
PDF, 531 KB
english, 2010
Conversion to is in progress
Conversion to is failed