Multilevel current stress technique for investigation thin...

IOP Conference Series Materials Science and Engineering 2012 / 12 Vol. 41

Multilevel current stress technique for investigation thin oxide layers of MOS structures

Andreev, V V, Bondarenko, G G, Maslovsky, V M, Stolyarov, A A
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
41
Language:
english
Journal:
IOP Conference Series: Materials Science and Engineering
DOI:
10.1088/1757-899x/41/1/012017
Date:
December, 2012
File:
PDF, 447 KB
english, 2012
Conversion to is in progress
Conversion to is failed