Characterization of the state of a droplet at a...

IOP Conference Series Materials Science and Engineering 2012 / 12 Vol. 42

Characterization of the state of a droplet at a micro-textured silicon wafer using a finite difference time-domain (FDTD) modeling method

Saad, N, Merheb, B, Nassar, G, Campistron, P, Carlier, J, Ajaka, M, Nongaillard, B
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Volume:
42
Language:
english
Journal:
IOP Conference Series: Materials Science and Engineering
DOI:
10.1088/1757-899x/42/1/012052
Date:
December, 2012
File:
PDF, 586 KB
english, 2012
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