Towards terahertz near-field microscopy

Towards terahertz near-field microscopy

van der Valk, N. C. J., Planken, P. C. M.
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Volume:
362
Language:
english
Journal:
Philosophical Transactions of the Royal Society A: Mathematical, Physical and Engineering Sciences
DOI:
10.1098/rsta.2003.1316
Date:
February, 2004
File:
PDF, 140 KB
english, 2004
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