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Nanoscale uniformity of pore architecture in diatomaceous silica: a combined small and wide angle x-ray scattering study
Engel G. Vrieling, Theo P. M. Beelen, Rutger A. Van Santen, Winfried W. C. GieskesVolume:
36
Year:
2000
Language:
english
Pages:
14
DOI:
10.1046/j.1529-8817.2000.99120.x
File:
PDF, 2.51 MB
english, 2000