[IEEE 2015 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS) - Amherst, MA, USA (2015.10.12-2015.10.14)] 2015 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS) - A non-conservative software-based approach for detecting illegal CFEs caused by transient faults

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