[IEEE 2015 IEEE 10th Conference on Industrial Electronics...

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[IEEE 2015 IEEE 10th Conference on Industrial Electronics and Applications (ICIEA) - Auckland, New Zealand (2015.6.15-2015.6.17)] 2015 IEEE 10th Conference on Industrial Electronics and Applications (ICIEA) - Data driven framework for degraded pogo pin detection in semiconductor manufacturing

Aye, Theint Theint, Yang, Feng, Wang, Long, Lee, Gary Kee Khoon, Li, Xiang, Hu, Jinwen, Nguyen, Manh Cuong
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Year:
2015
Language:
english
DOI:
10.1109/iciea.2015.7334137
File:
PDF, 1.73 MB
english, 2015
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