[IEEE 2015 IEEE 10th Conference on Industrial Electronics and Applications (ICIEA) - Auckland, New Zealand (2015.6.15-2015.6.17)] 2015 IEEE 10th Conference on Industrial Electronics and Applications (ICIEA) - Data driven framework for degraded pogo pin detection in semiconductor manufacturing
Aye, Theint Theint, Yang, Feng, Wang, Long, Lee, Gary Kee Khoon, Li, Xiang, Hu, Jinwen, Nguyen, Manh CuongYear:
2015
Language:
english
DOI:
10.1109/iciea.2015.7334137
File:
PDF, 1.73 MB
english, 2015