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[IEEE IEEE Sensors 2003 (IEEE Cat. No.03CH37498) - Toronto, Canada (Oct. 22-24, 2003)] Proceedings of IEEE Sensors 2003 (IEEE Cat. No.03CH37498) - Frequency dependence of the second derivative of the currant-voltage characteristic of the heterostructure SnO/sub 2/-Si at the gas adsorption
ll'chenko, V.V., Kravchenko, A.I., Telega, V.V., Chehun, V.P., Gaskov, A.M., Grinchenko, V.T.Volume:
1
Year:
2003
Language:
english
DOI:
10.1109/icsens.2003.1278914
File:
PDF, 132 KB
english, 2003