[IEEE 2014 IEEE 12th International Conference on Solid -State and Integrated Circuit Technology (ICSICT) - Guilin, China (2014.10.28-2014.10.31)] 2014 12th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT) - Study of the set statistical characteristics in the Cu/HfO2/Pt-based RRAM device
Zhang, Meiyun, Long, Shibing, Wang, Guoming, Li, Yang, Xu, Xiaoxin, Liu, Hongtao, Wang, Ming, Sun, Pengxiao, Sun, Haitao, Liu, Qi, Lv, Hangbing, Liu, MingYear:
2014
Language:
english
DOI:
10.1109/icsict.2014.7021264
File:
PDF, 885 KB
english, 2014