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[IEEE International Semiconductor Device Research Symposium, 2003 - Washington, DC, USA (Dec. 10-12, 2003)] International Semiconductor Device Research Symposium, 2003 - Impact of asymmetric metal coverage on high performance MOSFET mismatch
Fukumoto, J., Burleson, J., Das, T., Moon, J.E., Mukund, P.R.Year:
2003
Language:
english
DOI:
10.1109/isdrs.2003.1272201
File:
PDF, 149 KB
english, 2003