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[IEEE 2003 Bipolar/BiCMOS Circuits and Technology Meeting (IEEE Cat. No.03CH37440) - Portland, OR, USA (May 12-16, 2003)] Proceedings of the 2003 Bipolar/BiCMOS Circuits and Technology Meeting (IEEE Cat. No.03CH37440) - Low level RF system for Jefferson lab cryomodule test facility
Plawski, T., Allison, T., Delayen, J., Hovater, C., Powers, T.Volume:
4
Year:
2003
Language:
english
DOI:
10.1109/pac.2003.1289126
File:
PDF, 156 KB
english, 2003