Application of a Miniature Parallel Strip Line to Hard Disk Drive Immunity Test
Paoletti, Umberto, Noma, Tatsuji, Nishiyama, NobumasaYear:
2016
Language:
english
Journal:
IEEE Transactions on Electromagnetic Compatibility
DOI:
10.1109/temc.2016.2524551
File:
PDF, 969 KB
english, 2016