[IEEE 2015 IEEE Conference on Visual Analytics Science and Technology (VAST) - Chicago, IL, USA (2015.10.25-2015.10.30)] 2015 IEEE Conference on Visual Analytics Science and Technology (VAST) - A System for visual exploration of caution spots from vehicle recorder data
Itoh, Masahiko, Yokoyama, Daisaku, Toyoda, Masashi, Kitsuregawa, MasaruYear:
2015
Language:
english
DOI:
10.1109/vast.2015.7347677
File:
PDF, 1.26 MB
english, 2015