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[IEEE 2015 IFIP/IEEE International Conference on Very Large Scale Integration (VLSI-SoC) - Daejeon, South Korea (2015.10.5-2015.10.7)] 2015 IFIP/IEEE International Conference on Very Large Scale Integration (VLSI-SoC) - Filtering dirty data in DRAM to reduce PRAM writes
Park, Hyunsun, Kim, Chanha, Yoo, Sungjoo, Park, ChanikYear:
2015
Language:
english
DOI:
10.1109/vlsi-soc.2015.7314437
File:
PDF, 940 KB
english, 2015