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Nanometer scale characterization of polymer films by atomic-force microscopy
Teichert, Christian, Haas, Alfred, Wallner, Gernot M., Lang, Reinhold W.Volume:
181
Journal:
Macromolecular Symposia
DOI:
10.1002/1521-3900(200205)181:13.0.co;2-7
Date:
May, 2002
File:
PDF, 4.45 MB
2002